| Non-Destructive X-Ray Analysis |
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Without damaging the appearance or integrity of a sample, non-destructive analysis enables the detailed internal structure, elemental composition, or chemical structure of the sample to be obtained without destroying the sample.
Non-destructive testing includes X-ray technology for obtaining detailed 2D or 3D CT images of internal structures; non-destructive XRF for obtaining elemental information; commonly used Spectrum spectrometers for obtaining chemical structure information; and Ultrasonic testing for detecting voids or bubbles in electronic components. The most common analytical techniques include: transmission X-ray imaging, which can be applied to IC components, passive components, metal castings, complex parts, multilayer polymer products, printed circuit boards, mobile phones, panels, watches, and more. Without any disassembly, high-resolution 2D or 3D (X-ray CT) images can be obtained. |
